Advanced Transmission Electron Microscopy Imaging and Diffraction in Nanoscience

by Jian Min Zuo, John C.H. Spence

Advanced Transmission Electron Microscopy Imaging and Diffraction in Nanoscience This volume expands and updates the coverage in the authors popular 1992 book Electron Microdiffraction As the title implies the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy Special attention is given to electron diffraction and imaging including high resolution TEM and STEM imaging and the application of these methods to crystals their defects and nanostructures The autho

Publisher : Springer Verlag New York

Author : Jian Min Zuo, John C.H. Spence

ISBN : 9781493966059

Year : 2017

Language: en

File Size : 26.71 MB

Category : Engineering Transportation

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